Home > Library VÚGTK > Patents > Dvuchosnyj ekzamenator dlja issledovanija charakteristik izmeritelej naklona
 
Dvuchosnyj ekzamenator dlja issledovanija charakteristik izmeritelej naklona
Kaupelis, R. R. ; Varanauskas, P. A. ; Naumavičjus, R. G. ; Ragul'skis, K. M. ; Kaunasskij politechničeskij institut

Signature: SSSRPAT720302
Published: [S.l.]: [s.n.], 1980


Extent: 4 sl., obr.
Keywords: patenty
Publication type: patenty
Notes: 1 list. G 01 C 25/00., 1.3.1978, 5.3.1980

The record appears in these collections:
Library VÚGTK > Patents
Monographic Publications

 Record created 2014-01-11, last modified 2018-11-27
Similar records



Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)
Surveying Library of VUGTK :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.4
Maintained by knihovna@vugtk.cz
This site is also available in the following languages:
Česky  English