Home > Library VÚGTK > Patents > Dvuchosnyj ekzamenator dlja issledovanija charakteristik izmeritelej naklona |
Barcode | Library | Collection | Location | Description | Loan period | Status | Due date | Option(s) |
---|---|---|---|---|---|---|---|---|
198000682 | VÚGTK | - | SSSR PAT 720 302 | - | 4 weeks | - |