Home > Library VÚGTK > Patents > Sposob izmerenija linejnogo razmera elementov topologičeskogo risunka mikroschem |
Signature: SSSRPAT1146549
Published: [S.l.]: [s.n.], 1985
Extent: 4 s., 2 obr.
Keywords: patenty
Publication type: patenty
Notes: 1 sv., G 01 B 11/02., 8.4.1983, 23.3.1985
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